Study of indium tin oxide–MoS2 interface by atom probe tomography

The molybdenum disulfide (MoS2) and indium tin oxide (ITO) interface were studied by atom probe tomography (APT). Raman spectroscopy, scanning electron microscopy, and grazingincidence x-ray diffraction measurements were performed as complementary characterization. Results confirm that nanowires pla...

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主要作者: Ramos Murillo, Manuel Antonio
其他作者: Nogan, Jhon, Boll, Torben, Kauffmman-Weis, Sandra, Rodriguez Gonzalez, Claudia, Enriquez Carrejo, Jose Luis, Helmaier, Martin
格式: Artículo
语言:spa
出版: 2019
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在线阅读:https://doi.org/10.1557/mrc.2019.150
https://www.cambridge.org/core/journals/mrs-communications/article/study-of-indium-tin-oxidemos2-interface-by-atom-probe-tomography/C513A268D236C9B9204BA128250865D9
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