Study of indium tin oxide–MoS2 interface by atom probe tomography
The molybdenum disulfide (MoS2) and indium tin oxide (ITO) interface were studied by atom probe tomography (APT). Raman spectroscopy, scanning electron microscopy, and grazingincidence x-ray diffraction measurements were performed as complementary characterization. Results confirm that nanowires pla...
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| Other Authors: | , , , , , |
| Format: | Artículo |
| Language: | spa |
| Published: |
2019
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| Subjects: | |
| Online Access: | https://doi.org/10.1557/mrc.2019.150 https://www.cambridge.org/core/journals/mrs-communications/article/study-of-indium-tin-oxidemos2-interface-by-atom-probe-tomography/C513A268D236C9B9204BA128250865D9 |
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| Summary: | The molybdenum disulfide (MoS2) and indium tin oxide (ITO) interface were studied by atom probe tomography (APT). Raman spectroscopy, scanning electron microscopy, and grazingincidence x-ray diffraction measurements were performed as complementary characterization. Results confirm that nanowires plated shape with the 〈110〉-orientation are aligned perpendicular to the ITO film with principal reflections at (002), (100), (101), (201), and Raman spectroscopy vibrational modes at E 2g at 378 cm and A1g at 407 cm correspond to 2H-MoS2. APT reveals MoS , MoS as predominant evaporated
molecular ions on the sample, indicating no significant diffusion/segregation of Mo or S species within the ITO layer. |
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