A reliability analysis for electronic devices under an extension of exponentiated perks distribution

This paper presents a reliability analysis for electronic devices (ED) with bathtub curve-shaped failure times. An extension of the exponentiated perks distribution (EPD) is proposed for the analysis. The extension of this new distribution is based on the Alpha Power Transformation, so the Alpha...

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Bibliografische gegevens
Hoofdauteur: Méndez-González, Luis Carlos
Andere auteurs: Quezada Carreon, Abel Eduardo, Rodriguez Picon, Luis Alberto, Perez Olguin, Ivan Juan Carlos, García, Vicente
Formaat: Artículo
Taal:English
Gepubliceerd in: 2022
Onderwerpen:
Online toegang:https://doi.org/10.1002/qre.3255
https://onlinelibrary.wiley.com/doi/10.1002/qre.3255
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