A reliability analysis for electronic devices under an extension of exponentiated perks distribution

This paper presents a reliability analysis for electronic devices (ED) with bathtub curve-shaped failure times. An extension of the exponentiated perks distribution (EPD) is proposed for the analysis. The extension of this new distribution is based on the Alpha Power Transformation, so the Alpha...

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Bibliographic Details
Main Author: Méndez-González, Luis Carlos
Other Authors: Quezada Carreon, Abel Eduardo, Rodriguez Picon, Luis Alberto, Perez Olguin, Ivan Juan Carlos, García, Vicente
Format: Artículo
Published: 2022
Online Access:https://doi.org/10.1002/qre.3255
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