Méndez-González, L. C., Quezada Carreon, A. E., Rodriguez Picon, L. A., Perez Olguin, I. J. C., & García, V. (2022). A reliability analysis for electronic devices under an extension of exponentiated perks distribution.
Chicago Style (17th ed.) CitationMéndez-González, Luis Carlos, Abel Eduardo Quezada Carreon, Luis Alberto Rodriguez Picon, Ivan Juan Carlos Perez Olguin, and Vicente García. A Reliability Analysis for Electronic Devices Under an Extension of Exponentiated Perks Distribution. 2022.
MLA (8th ed.) CitationMéndez-González, Luis Carlos, et al. A Reliability Analysis for Electronic Devices Under an Extension of Exponentiated Perks Distribution. 2022.
Warning: These citations may not always be 100% accurate.