A reliability analysis for electronic devices under an extension of exponentiated perks distribution
This paper presents a reliability analysis for electronic devices (ED) with bathtub curve-shaped failure times. An extension of the exponentiated perks distribution (EPD) is proposed for the analysis. The extension of this new distribution is based on the Alpha Power Transformation, so the Alpha...
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| Main Author: | |
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| Other Authors: | , , , |
| Format: | Artículo |
| Language: | English |
| Published: |
2022
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| Subjects: | |
| Online Access: | https://doi.org/10.1002/qre.3255 https://onlinelibrary.wiley.com/doi/10.1002/qre.3255 |
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| Summary: | This paper presents a reliability analysis for electronic devices (ED) with bathtub
curve-shaped failure times. An extension of the exponentiated perks distribution
(EPD) is proposed for the analysis. The extension of this new distribution
is based on the Alpha Power Transformation, so the Alpha Exponentiated Perks
Distribution (AEXP) is introduced. The AEXP has three shape parameters and
one scale parameter, allowing greater flexibility to represent failure rates in an
increasing, decreasing, or bathtub curve form. Some useful properties in the reliability
engineering context are presented. AEXP parameters were estimated via
the Maximum Likelihood Method. Finally, two case studies focused on ED are
used to compare the proposed distribution and other distributions with similar
failure rate representation properties. The obtained results show that the
AEXP better describes the behavior of ED than the distributions considered in
the analysis. |
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